Metrology

Computed tomography offers considerable advantages over conventional optical or tactile Coordinate Measuring Machines especially when measuring complex parts with hidden surface or features which are difficult to access. Our metrology equipment consist computed tomography systems for high precision 3D metrology of the complete internal and external geometry of the object.

Features & Benefits

  • Unique temperature stabilized digital GE DXR detector enables extremely high image quality for a high-dynamic range 

  • Unique spatial and contrast resolution from small material to medium sized plastic samples covering three orders of magnitude 

  • Optimized 3D metrology package for stable acquisition conditions, fast reconstruction within minutes and reproducible measurement results

  • The fully three dimensional CT information supports non-destructive visualization of slices, arbitrary sectional views, automatic pore analysis, and others· The phoenix v|tome|x L 450 system, with its granite-based manipulatio  handles even large samples with highest precision.

  • Extreme high-resolution scans of low absorbing materials as well as for 3D analysis of high absorbing objects

  • Application

Related